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MET Labs, Santa Clara hosts EPCglobal event for item-level tagging
ADDED: 5/23/2006 7:12:00 AM
Santa Clara, CA - MET Laboratories hosted an EPCglobal event where RFID vendors demonstrated their technology solutions to seven item-level tagging "use cases" or scenarios. Chosen by EPCglobal’s Item Level Tagging Joint Requirements Group, the use cases were representative of the real-life situations in which item-level tagging might be used and demonstrated the challenges that the technology must overcome. They ranged from garments on a moving metal rack, to goods in a stable shelf environment, to a random mix of different products placed together in a tote bag.
The item-level technology demonstration saw 56 demos from multiple vendors. Ultrahigh, high, and low frequency technologies were demonstrated. There were many RFID end user companies represented, withover 150 attendees on the whole. MET additionally performed emissions testing to assure all devices were within Cappropriate regulatory guidelines.
To learn more about MET's RFID testing click here
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